AREA CONSORTIUM DATABASES
The databases below have been compiled using AREA Consortium data from past projects.
Component Database
Author: Michael Meilunas
Description: The component database is a compilation of thermal cycling reliability data for the past 3 years on all components tested in the AREA Consortium. Test board stack-up, thickness and material data is provided as well as component physical dimensions and CTE measurements by PEMI moire. This database is intended for our members to use as a resource for reliability test estimation on their product and for modeling purposes.
Circuit Board Database
Author: Wayne Jones
Description: This database contains all the test results of various member and consortium test boards in context of 9x reflow survival, strength testing and material properties.